Scanning Electron Microscope

Scanning Electron Microscope (SEM)

Up to x400,000 Magnafication

Low vacuum capabilities

Identify the elemental composition of materials

2D measurement capability

Robinson BSE Detector

Capabilities

Provides magnified images of all manner of objects from 50x to 400,000x
Can identify the elemental composition of materials
Low vacuum capability facilitates analysis of nonconductive or partially conductive samples such as printed circuit boards
2D measurement capability at all magnifications allows precision quality control analysis

Specifications

Variable Pressure Specimen Chamber Low Vacuum BSE Mode for Sample Charging Mitigation Chamber Pressure to 4Torr in 25 Millitorr Steps Hi Vacuum SE Mode for Standard High Resolution SEM Imaging Electron Gun: LaB6 Ion Pumped - and Tungsten Accelerating Voltage: 100volts to 30kV High Vacuum Image Resolution: 4nm @ 30kV Low Vacuum Image Resolution: 6nm @ 30kV Magnification: x10 – x400,000 Secondary Electron Image	Probe Current: 1pA to 5nA Range TURBO Pumped Specimen Chamber Robinson BSE Detector 3 Axis Motorized Stage X/Y = 125mm Z = 100mm ROTATION = 360 Degrees Continuous TILT = -5 to +90 Degrees PC Controlled Stage Automation and SEM Control Backscatter Detector Energy Dispersive Spectrometer with state of the art Silicon Drift Detector